Pattern Recognition: 32nd DAGM Symposium, Darmstadt, Germany, September 22-24, 2010. Proceedings By David Gallup, Marc Pollefeys, Jan-Michael Frahm (auth.), Michael Goesele, Stefan Roth, Arjan Kuijper, Bernt Schiele, Konrad Schindler (eds.)
2010 | 574 Pages | ISBN: 3642159850 | PDF | 23 MB