Analog IC Reliability in Nanometer CMOS (Analog Circuits and Signal Processing) by Elie Maricau and Georges Gielen
English | 2013 | ISBN: 1461461626 | 240 pages | PDF | 4,8 MB
This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared.