Design of Vlsi Circuits: Based on Venus

Frequency Domain Analysis and Design of Nonlinear Systems based on Volterra Series Expansion (repost)

Xingjian Jing, Ziqiang Lang, "Frequency Domain Analysis and Design of Nonlinear Systems based on Volterra Series Expansion: A Parametric Characteristic Approach"
2015 | ISBN-10: 3319123904 | 331 pages | PDF | 8 MB
Frequency Domain Analysis and Design of Nonlinear Systems based on Volterra Series Expansion

Xingjian Jing, Ziqiang Lang, "Frequency Domain Analysis and Design of Nonlinear Systems based on Volterra Series Expansion: A Parametric Characteristic Approach"
English | 2015 | pages: 339 | ISBN: 3319123904 | PDF | 8,3 mb

Frequency Domain Analysis and Design of Nonlinear Systems based on Volterra Series Expansion  eBooks & eLearning

Posted by Underaglassmoon at March 30, 2015
Frequency Domain Analysis and Design of Nonlinear Systems based on Volterra Series Expansion

Frequency Domain Analysis and Design of Nonlinear Systems based on Volterra Series Expansion: A Parametric Characteristic Approach
Springer | Physics | Feb. 18 2015 | ISBN-10: 3319123904 | 331 pages | pdf | 8.3 mb

by Xingjian Jing (Author), Ziqiang Lang (Author)
Design of Intelligent Systems Based on Fuzzy Logic, Neural Networks and Nature-Inspired Optimization

Patricia Melin, Oscar Castillo, "Design of Intelligent Systems Based on Fuzzy Logic, Neural Networks and Nature-Inspired Optimization"
2015 | ISBN-10: 331917746X | 652 pages | PDF | 19 MB
Design of Intelligent Systems Based on Fuzzy Logic, Neural Networks and Nature-Inspired Optimization

Patricia Melin, "Design of Intelligent Systems Based on Fuzzy Logic, Neural Networks and Nature-Inspired Optimization "
English | ISBN: 331917746X | 2015 | 637 pages | EPUB, PDF | 12 MB + 19 MB

Soft Error Reliability of VLSI Circuits  eBooks & eLearning

Posted by hill0 at Oct. 22, 2020
Soft Error Reliability of VLSI Circuits

Soft Error Reliability of VLSI Circuits: Analysis and Mitigation Techniques
by Behnam Ghavami

English | 2021 | ISBN: 3030516091 | 127 Pages | PDF EPUB | 11 MB

Power-Constrained Testing of VLSI Circuits (Repost)  eBooks & eLearning

Posted by DZ123 at Dec. 25, 2017
Power-Constrained Testing of VLSI Circuits (Repost)

Nicola Nicolici, Bashir M. Al-Hashimi, "Power-Constrained Testing of VLSI Circuits"
English | 2003 | ISBN: 140207235X | PDF | pages: 191 | 10.7 mb

IDDQ Testing of VLSI Circuits  eBooks & eLearning

Posted by AvaxGenius at Jan. 30, 2021
IDDQ Testing of VLSI Circuits

IDDQ Testing of VLSI Circuits by Ravi K. Gulati
English | PDF | 1992 | 121 Pages | ISBN : 1461363772 | 18.8 MB

Power supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid-1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply from an intuitive sense that CMOS ICs showing abnormal quiescent power supply current (IDDQ) contained defects.

Power-Constrained Testing of VLSI Circuits  eBooks & eLearning

Posted by tot167 at June 10, 2009
Power-Constrained Testing of VLSI Circuits

Nicola Nicolici, Bashir M. Al-Hashimi, "Power-Constrained Testing of VLSI Circuits"
Springer | 2003 | ISBN: 140207235X | 180 pages | PDF | 10 MB

Symbolic Analysis and Reduction of VLSI Circuits (Repost)  eBooks & eLearning

Posted by AvaxGenius at Sept. 13, 2023
Symbolic Analysis and Reduction of VLSI Circuits (Repost)

Symbolic Analysis and Reduction of VLSI Circuits by Zhanhai Qin , Sheldon X. D. Tan , Chung-Kuan Cheng
English | PDF | 2005 | 295 Pages | ISBN : 0387239049 | 11.3 MB

Symbolic analysis is an intriguing topic in VLSI designs. The analysis methods are crucial for the applications to the parasitic reduction and analog circuit evaluation. However, analyzing circuits symbolically remains a challenging research issue. Therefore, in this book, we survey the recent results as the progress of on-going works rather than as the solution of the field.