Yuan Taur, Tak H. Ning, "Fundamentals of Modern VLSI Devices, 2nd Edition"
English | 2009-08-28 | ISBN: 0521832942 | 680 pages | PDF | 30 MB
Learn the basic properties and designs of modern VLSI devices, as well as the factors affecting performance, with this thoroughly updated second edition. The first edition has been widely adopted as a standard textbook in microelectronics in many major US universities and worldwide. The internationally-renowned authors highlight the intricate interdependencies and subtle tradeoffs between various practically important device parameters, and also provide an in-depth discussion of device scaling and scaling limits of CMOS and bipolar devices.