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This book describes the development of a constitutive modeling platform for soil testing, which is one of the key components in geomechanics and geotechnics. It discusses the fundamentals of the constitutive modeling of soils and illustrates the use of these models to simulate various laboratory tests.

This textbook provides a step-by-step approach to numerical methods in engineering modelling. The authors provide a consistent treatment of the topic, from the ground up, to reinforce for students that numerical methods are a set of mathematical modelling tools which allow engineers to represent real-world systems and compute features of these systems with a predictable error rate.

During the first decade following the invention of the transistor, progress in semiconductor device technology advanced rapidly due to an effective synergy of technological discoveries and physical understanding. Through physical reasoning, a feeling for the right assumption and the correct interpretation of experimental findings, a small group of pioneers conceived the major analytic design equations, which are currently to be found in numerous textbooks. Naturally with the growth of specific applications, the description of some characteristic properties became more complicated. For instance, in inte­ grated circuits this was due in part to the use of a wider bias range, the addition of inherent parasitic elements and the occurrence of multi­ dimensional effects in smaller devices. Since powerful computing aids became available at the same time, complicated situations in complex configurations could be analyzed by useful numerical techniques. Despite the resulting progress in device optimization, the above approach fails to provide a required compact set of device design and process control rules and a compact circuit model for the analysis of large-scale electronic designs. This book therefore takes up the original thread to some extent. Taking into account new physical effects and introducing useful but correct simplifying assumptions, the previous concepts of analytic device models have been extended to describe the characteristics of modern integrated circuit devices. This has been made possible by making extensive use of exact numerical results to gain insight into complicated situations of transistor operation.

This book shows in a comprehensive presentation how Bond Graph methodology can support model-based control, model-based fault diagnosis, fault accommodation, and failure prognosis by reviewing the state-of-the-art, presenting a hybrid integrated approach to Bond Graph model-based fault diagnosis and failure prognosis, and by providing a review of software that can be used for these tasks.

In survival analysis there has long been a need for models that goes beyond the Cox model as the proportional hazards assumption often fails in practice. This book studies and applies modern flexible regression models for survival data with a special focus on extensions of the Cox model and alternative models with the specific aim of describing time-varying effects of explanatory variables.