Flaw Assessment

The present short monograph concerns analytic and semi-analytic techniques for finding an approximate value of the limit load. The limit load is an essential input parameter of flaw assessment procedures. In most cases, finding the limit load involves some numerical calculations of different levels of complexity, including numerical minimization of functions of one or several arguments, the slip-line technique and the finite element method.

Something over a year ago, I was fortunate enough to preview another VNR book, Controlling Conducted Emissions by Design, by John Fluke. My assessment at the time was that Mr. Fluke had written a very good and useful volume, its only flaw being that it focused on just half of the EMI emissions problem. This, of course, was also its strength; although radiated and conducted emissions do not exist in separate worlds, it can be useful, at least as a point of departure, to look at them as distinct phenomena. Expanding the scope of the conducted emissions book therefore would have served mostly to dilute its purpose and compromise its clarity. After some informal discussions with the publisher on that subject, it was de­ cided to correct the sin of omission by recruiting an author for a companion vol­ ume, to be titled Controlling Radiated Emissions by Design.

The non-technical handbook for cyber security in the insurance industry

The non-technical handbook for cyber security risk management