Mssbauer Effect Methodology

Learn how to deploy this crucial root cause tool

This monograph analyses in detail the physical aspects of the elastic waves radiation during deformation or fracture of materials. I presents the methodological bases for the practical use of acoustic emission device, and describes the results of theoretical and experimental researches of evaluation of the crack growth resistance of materials, selection of the useful AE signals. The efficiency of this methodology is shown through the diagnostics of various-purpose industrial objects. The authors obtain results of experimental researches with the help of the new methods and facilities.

This book aims to provide a unified methodology to derive models for fatigue life prediction. This includes S-N, e-N and crack propagation models. This book is unique in that it contemplates the three main fatigue approaches (stress-based, strain-based and fracture mechanics) from a novel and integrated point of view. As an alternative to the preferential attention paid to deterministic models based on the physical, phenomenological and empirical description of fatigue, their probabilistic nature is emphasized in this book, in which stochastic fatigue and crack growth models are presented.

The remarkable development of organic thin film transistors (OTFTs) has led to their emerging use in active matrix flat-panel displays, radio frequency identification cards, and sensors. Exploring one class of OTFTs, Organic Field-Effect Transistors provides a comprehensive, multidisciplinary survey of the present theory, charge transport studies, synthetic methodology, materials characterization, and current applications of organic field-effect transistors (OFETs). Covering various aspects of OFETs, the book begins with a theoretical description of charge transport in organic semiconductors at the molecular level. It then discusses the current understanding of charge transport in single-crystal devices, small molecules and oligomers, conjugated polymer devices, and charge injection issues in organic transistors.