Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy, "Scanning Electron Microscopy and X-Ray Microanalysis, 4th Edition"
English | 2017 | ISBN: 149396674X, 1493982699 | 573 pages | True PDF | 73.5 MB