M. Bushnell, Vishwani Agrawal, "Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits"
English | 2000 | ISBN: 0792379918, 0306470403 | 712 pages | PDF | 36,9 MB
Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on all three types of circuits.