VLSI-SoC: Design for Reliability, Security, and Low Power: 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers by Youngsoo Shin, Chi Ying Tsui, Jae-Joon Kim, Kiyoung Choi, Ricardo Reis
English | 2016 | ISBN: 331946096X | 223 Pages | PDF | 49.8 MB
This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015.