Test Development

The software developer National Instruments is pleased to announce the availability of Static Test Software Suite 1.1. This suite includes software to help you work with data collected in static or fatigue structural tests for aerospace applications.

Learn NodeJS, Jest programming by developing Express JS webserver with mongodb. Master Jest to do unit/integration tests.

This book combines insights from language assessment literacy and critical language testing through critical analyses and research about challenges in language assessment around the world. It investigates problematic practices in language testing which are relevant to language test users such as language program directors, testing centers, and language teachers, as well as teachers-in-training in Graduate Diploma and Master of Arts in Applied Linguistics programs. These issues involve aspects of language testing such as test development, test administration, scoring, and interpretation/use of test results.

This book combines insights from language assessment literacy and critical language testing through critical analyses and research about challenges in language assessment around the world. It investigates problematic practices in language testing which are relevant to language test users such as language program directors, testing centers, and language teachers, as well as teachers-in-training in Graduate Diploma and Master of Arts in Applied Linguistics programs. These issues involve aspects of language testing such as test development, test administration, scoring, and interpretation/use of test results.

Test Resource Partitioning for System-on-a-Chip is about test resource partitioning and optimization techniques for plug-and-play system-on-a-chip (SOC) test automation. Plug-and-play refers to the paradigm in which core-to-core interfaces as well as core-to-SOC logic interfaces are standardized, such that cores can be easily plugged into "virtual sockets" on the SOC design, and core tests can be plugged into the SOC during test without substantial effort on the part of the system integrator.

Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.