X-Ray Microscopy and Spectromicroscopy: Status Report from the Fifth International Conference, Würzburg, August 19–23, 1996 By W. Meyer-Ilse, H. Medecki, J. T. Brown, J. M. Heck, E. H. Anderson, A. Stead, T. Ford (auth.), Dr. Jürgen Thieme, Professor Dr. Günter Schmahl, Dr. Dietbert Rudolph, Professor Dr. Eberhard Umbach (eds.)
1998 | 383 Pages | ISBN: 3642721087 | PDF | 25 MB