Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials by Otwin Breitenstein, Wilhelm Warta and Martin Langenkamp
English | 2010 | ISBN: 3642024165 | 255 pages | PDF | 6,3 MB
This book deals with lock-in thermography (LIT) as a special active dynamic variant of the well-known IR thermography. It enables a much improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography.