Electron Backscatter Diffraction in Materials Science by Adam J. Schwartz, Mukul Kumar, David P. Field and Brent L. Adams
English | 1 edition | September 30, 2000 | ISBN-10: 030646487X | 350 pages | PDF | 59,2 Mb
Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy (TEM) or electron channeling for local crystallographic information.