Vlsi Design And Test

Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on all three types of circuits.

by Selahattin Sayil (Author)

Power consumption of VLSI (Very Large Scale Integrated) circuits has been growing at an alarmingly rapid rate. This increase in power consumption, coupled with the increasing demand for portable/hand-held electronics, has made power consumption a dominant concern in the design of VLSI circuits today. Traditionally, dynamic (switching) power has dominated the total power consumption of an IC. However, due to current scaling trends, leakage power has now become a major component of the total power consumption in VLSI circuits. Leakage power reduction is especially important in portable/hand-held electronics such as cell-phones and PDAs.

A complete review and question solution for Electrical Engineering Exam

The testing of digital circuits has been problematic since time immemorial; however with the introduction of VLSI the problems have been aggravated by several factors in addition to those associated with the increase in complexity and reduction in the pin to gate ratio.