Wafer Level

Wafer-Level Testing and Test During Burn-In for Integrated Circuits  eBooks & eLearning

Posted by nebulae at March 20, 2014
Wafer-Level Testing and Test During Burn-In for Integrated Circuits

Sudarshan Bahukudumbi, Krishnendu Chakrabarty, "Wafer-Level Testing and Test During Burn-In for Integrated Circuits"
English | ISBN: 1596939893 | 2010 | 215 pages | PDF | 3 MB

Wafer-Level Testing and Test During Burn-In for Integrated Circuits (Repost)  eBooks & eLearning

Posted by nebulae at Oct. 28, 2017
Wafer-Level Testing and Test During Burn-In for Integrated Circuits (Repost)

Sudarshan Bahukudumbi, Krishnendu Chakrabarty, "Wafer-Level Testing and Test During Burn-In for Integrated Circuits"
English | ISBN: 1596939893 | 2010 | 215 pages | PDF | 3 MB

Wafer-Level Chip-Scale Packaging: Analog and Power Semiconductor Applications  eBooks & eLearning

Posted by roxul at Nov. 16, 2014
Wafer-Level Chip-Scale Packaging: Analog and Power Semiconductor Applications

Shichun Qu, Yong Liu, "Wafer-Level Chip-Scale Packaging: Analog and Power Semiconductor Applications"
English | ISBN: 149391555X | 2015 | 342 pages | PDF | 19 MB

Fan-Out Wafer-Level Packaging  eBooks & eLearning

Posted by AvaxGenius at April 6, 2018
Fan-Out Wafer-Level Packaging

Fan-Out Wafer-Level Packaging By John H. Lau
English | PDF,EPUB | 2018 | 319 Pages | ISBN : 9811088837 | 43.02 MB

This comprehensive guide to fan-out wafer-level packaging (FOWLP) technology compares FOWLP with flip chip and fan-in wafer-level packaging. It presents the current knowledge on these key enabling technologies for FOWLP, and discusses several packaging technologies for future trends. The Taiwan Semiconductor Manufacturing Company (TSMC) employed their InFO (integrated fan-out) technology in A10, the application processor for Apple’s iPhone, in 2016, generating great excitement about FOWLP technology throughout the semiconductor packaging community.

Advances in Embedded and Fan-Out Wafer Level Packaging Technologies  eBooks & eLearning

Posted by roxul at April 29, 2019
Advances in Embedded and Fan-Out Wafer Level Packaging Technologies

Beth Keser and Steffen Kroehnert, "Advances in Embedded and Fan-Out Wafer Level Packaging Technologies"
English | ISBN: 1119314135 | 2019 | 576 pages | PDF | 29 MB

Wafer-Level Chip-Scale Packaging: Analog and Power Semiconductor Applications  eBooks & eLearning

Posted by DZ123 at Oct. 31, 2019
Wafer-Level Chip-Scale Packaging: Analog and Power Semiconductor Applications

Shichun Qu, Yong Liu, "Wafer-Level Chip-Scale Packaging: Analog and Power Semiconductor Applications"
English | 2014 | ISBN: 149391555X | PDF | pages: 336 | 19.3 mb

Wafer Level 3-D ICs Process Technology (repost)  eBooks & eLearning

Posted by tot167 at Dec. 20, 2010
Wafer Level 3-D ICs Process Technology (repost)

Chuan Seng Tan, Ronald J. Gutmann, L. Rafael Reif, "Wafer Level 3-D ICs Process Technology"
Spri/nger | 2008 | ISBN: 0387765328 | 410 pages | PDF | 11,1 MB

Wafer Level 3-D ICs Process Technology  eBooks & eLearning

Posted by tot167 at July 1, 2009
Wafer Level 3-D ICs Process Technology

Chuan Seng Tan, Ronald J. Gutmann, L. Rafael Reif, "Wafer Level 3-D ICs Process Technology"
Springer | 2008 | ISBN: 0387765328 | 410 pages | PDF | 11,1 MB

Wafer Level 3-D ICS Process Technology [Repost]  eBooks & eLearning

Posted by Free butterfly at Nov. 29, 2015
Wafer Level 3-D ICS Process Technology [Repost]

Wafer Level 3-D ICS Process Technology by Chuan Seng Tan
English | 19 Sept. 2008 | ISBN: 0387765328 | 365 Pages | PDF | 14 MB

This book focuses on foundry-based process technology that enables the fabrication of 3-D ICs. The core of the book discusses the technology platform for pre-packaging wafer lever 3-D ICs. However, this book does not include a detailed discussion of 3-D ICs design and 3-D packaging.
Embedded and Fan-Out Wafer and Panel Level Packaging Technologies for Advanced Application Spaces

Embedded and Fan-Out Wafer and Panel Level Packaging Technologies for Advanced Application Spaces
by Keser, Beth;Kröhnert, Steffen;

English | 2021 | ISBN: ‎ 1119793777 , 978-1119793779 | 323 pages | True PDF | 20.32 MB