Vlsi Design And Test

Power-Constrained Testing of VLSI Circuits  eBooks & eLearning

Posted by tot167 at June 10, 2009
Power-Constrained Testing of VLSI Circuits

Nicola Nicolici, Bashir M. Al-Hashimi, "Power-Constrained Testing of VLSI Circuits"
Springer | 2003 | ISBN: 140207235X | 180 pages | PDF | 10 MB

Digital System Design using Verilog HDL  eBooks & eLearning

Posted by BlackDove at April 12, 2022
Digital System Design using Verilog HDL

Digital System Design using Verilog HDL
Genre: eLearning | MP4 | Video: h264, 1280x720 | Audio: AAC, 44.1 KHz
Language: English | Size: 1.17 GB | Duration: 2h 41m


PC653EC || DSDV || Electronics and Communication Engineering || 6th SEM || Bachelor of Engineering
Design of Analog Fuzzy Logic Controllers in CMOS Technologies: Implementation, Test and Application

Design of Analog Fuzzy Logic Controllers in CMOS Technologies: Implementation, Test and Application by Carlos Dualibe
English | PDF | 2003 | 220 Pages | ISBN : 1402073593 | 18 MB

Nowadays, real-time applications of Fuzzy Logic in different domains are being increasingly reported. ASIC-based analog hardware becomes an interesting solution for these kinds of applications because it benefits from: savings on silicon surface and power consumption, readily accomplishment with strict timing constraints and cost-effective production. This book focuses in-depth on the VLSI CMOS implementation and application of programmable analog Fuzzy Logic Controllers following a mixed-signal philosophy. This is to say, signals are processed in the analog domain whereas programmability is achieved by means of standard digital memories.

Test and Diagnosis for Small-Delay Defects (repost)  eBooks & eLearning

Posted by interes at Jan. 11, 2015
Test and Diagnosis for Small-Delay Defects (repost)

Test and Diagnosis for Small-Delay Defects by Mohammad Tehranipoor and Ke Peng
English | 2011-09-27 | ISBN: 1441982965 | PDF | 228 pages | 3,6 MB

Test and Diagnosis for Small-Delay Defects [Repost]  eBooks & eLearning

Posted by ChrisRedfield at May 31, 2013
Test and Diagnosis for Small-Delay Defects [Repost]

Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty - Test and Diagnosis for Small-Delay Defects
Published: 2011-09-27 | ISBN: 1441982965 | PDF | 228 pages | 7 MB
Integrated Circuits Multiple Choice Questions and Answers (MCQs): Quizzes & Practice Tests with Answer Key


Integrated Circuits Multiple Choice Questions and Answers (MCQs): Quizzes & Practice Tests with Answer Key by Arshad Iqbal
English | 2020 | ASIN: B085HRZMXP | 223 Pages | PDF | 1.11 MB

Verilog HDL programming with practical approach  eBooks & eLearning

Posted by ELK1nG at Jan. 17, 2022
Verilog HDL programming with practical approach

Verilog HDL programming with practical approach
MP4 | Video: h264, 1280x720 | Audio: AAC, 44.1 KHz
Language: English | Size: 2.82 GB | Duration: 6h 47m

Fundamentals, levels of design description, Datatypes, test benchs, Tasks & system tasks, FSM with examples & Projects

Cracking Digital VLSI Verification Interview: Interview Success  eBooks & eLearning

Posted by DZ123 at May 19, 2022
Cracking Digital VLSI Verification Interview: Interview Success

Ramdas Mozhikunnath, Robin Garg, "Cracking Digital VLSI Verification Interview: Interview Success"
English | 2016 | ISBN: 1519089864 | ASIN: B01CZ0Z08E | EPUB | pages: 228 | 1.1 mb

Cracking Digital VLSI Verification Interview: Interview Success  eBooks & eLearning

Posted by arundhati at April 23, 2023
Cracking Digital VLSI Verification Interview: Interview Success

Ramdas Mozhikunnath, "Cracking Digital VLSI Verification Interview: Interview Success"
English | ISBN: 1519089864 | 2016 | 228 pages | PDF | 3 MB

Test Generation of Crosstalk Delay Faults in VLSI Circuits  eBooks & eLearning

Posted by AvaxGenius at Sept. 21, 2018
Test Generation of Crosstalk Delay Faults in VLSI Circuits

Test Generation of Crosstalk Delay Faults in VLSI Circuits by S. Jayanthy
English | PDF,EPUB | 2018 (2019 Edition) | 161 Pages | ISBN : 9811324921 | 4.33 MB

This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.