"Encyclopedia of Materials Characterization: Surfaces, Interfaces, Thin Films" ed. by Charles A. Evans, C. Richard Brundle, Shaun Wilson
Materials Characterization Series
Вuttеrwоrth-Неinеmаnn | 1992 | ISBN: 0750691689 9780750691680 | 782 pages | PDF | 20 MB
This is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis.
An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the Series. It describes widely-ranging techniques in a jargon-free manner and includes summary pages for each technique to supply a quick survey of its capabilities.