Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach (Microsystems) by Tomi Laurila, Vesa Vuorinen, Mervi Paulasto-Kröckel and Markus Turunen
English | ISBN: 1447124693 | 2012 | 226 pages | PDF | 5,6 MB
Interfaces between dissimilar materials are met everywhere in microelectronics and microsystems. In order to ensure faultless operation of these highly sophisticated structures, it is mandatory to have fundamental understanding of materials and their interactions in the system.